Azumino, Japan

Ken Kaneko

This inventor holds 1 USPTO granted patent. Top assignee: Sanyo Epson Imaging Devices Corp.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ken Kaneko. Retrieved from https://idiyas.com/inventor/ken-kaneko-h9ce5ecq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Ken Kaneko: Innovator in Electro-Optical Devices

Introduction

Ken Kaneko is a notable inventor based in Azumino, Japan. He has made significant contributions to the field of electro-optical devices. His innovative work has led to the development of a unique mounting structure that enhances the functionality of electronic components.

Latest Patents

Ken Kaneko holds a patent for a "Mounting structure, electro-optical device, and electronic apparatus." This patent describes a mounting structure that includes a substrate, a line formed on the substrate, and an electronic component with a terminal made of elastic material. The terminal features a protrusion that connects to the substrate, with a conductive member that is electrically linked to the line. The invention also incorporates an adhesive mixed with metal powders, which serves to bond and secure the electronic component to the substrate.

Career Highlights

Ken Kaneko is associated with Sanyo Epson Imaging Devices Corporation, where he applies his expertise in developing advanced electronic solutions. His work has been instrumental in improving the efficiency and reliability of electronic devices.

Conclusion

Ken Kaneko's contributions to the field of electro-optical devices exemplify the spirit of innovation. His patent reflects a deep understanding of electronic component design and functionality. Through his work, he continues to influence the advancement of technology in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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