Ken-ichi Ichino

Title: Ken-ichi Ichino: Innovator in Test Pattern Generation

Introduction

Ken-ichi Ichino is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of integrated circuit testing through his innovative approaches. His work focuses on optimizing the testing process, which is crucial for the reliability of electronic devices.

Latest Patents

Ken-ichi Ichino holds a patent for a "Method and apparatus for determining optimum initial value for test pattern generator." The purpose of this invention is to determine an optimum initial value to be input to a test pattern generator in order to achieve efficient testing of an integrated circuit. The process involves obtaining a minimum test length through fault simulations and iteratively computing initial values that yield shorter test lengths. This method enhances the efficiency of integrated circuit testing.

Career Highlights

Ichino is associated with the Semiconductor Technology Academic Research Center, where he applies his expertise in semiconductor technology. His innovative work has positioned him as a key figure in the field of integrated circuit testing.

Collaborations

Ken-ichi Ichino has collaborated with notable colleagues such as Masayuki Arai and Satoshi Fukumoto. Their combined efforts contribute to advancements in semiconductor technology and testing methodologies.

Conclusion

Ken-ichi Ichino's contributions to the field of integrated circuit testing through his innovative patent demonstrate his commitment to enhancing technology. His work continues to influence the efficiency of testing processes in the semiconductor industry.