Ken Flaton

Title: Ken Flaton: Innovator in Particle Removal Technology

Introduction

Ken Flaton is an accomplished inventor based in Harvard, MA (US). He has made significant contributions to the field of particle removal technology, particularly in applications related to microbiological analysis. His innovative approach has led to the development of a patented method that enhances the accuracy of microorganism counting in various samples.

Latest Patents

Ken Flaton holds a patent titled "Use of clean and dry gas for particle removal and assembly therefor." This invention features particle removal assemblies and methods designed to eliminate dust and other debris from sample containers. The goal is to improve the counting of colonies of microorganisms, such as bacteria, fungi, or protists, found in environmental, pharmaceutical, biological, and other samples. The assembly includes essential components for particle removal, including a filter, a dryer, a flow controller, and an outlet. Additionally, the invention provides methods for detecting samples after cleaning a sample container with clean and/or dry gas.

Career Highlights

Ken Flaton is currently employed at Rapid Micro Biosystems, Inc., where he continues to innovate in the field of microbiological analysis. His work focuses on enhancing the reliability and efficiency of particle removal processes, which are crucial for accurate scientific research and testing.

Collaborations

Ken collaborates with Rich Higgins, a fellow professional in the field. Their combined expertise contributes to the advancement of technologies that improve laboratory practices and outcomes.

Conclusion

Ken Flaton's contributions to particle removal technology exemplify the impact of innovation in scientific research. His patented methods and ongoing work at Rapid Micro Biosystems, Inc. highlight the importance of developing efficient solutions for accurate microorganism analysis.