Houston, TX, United States of America

Kelvin I Amalokwu

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Exxonmobil Technology and Engineering Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kelvin I Amalokwu. Retrieved from https://idiyas.com/inventor/kelvin-i-amalokwu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kelvin I. Amalokwu and Subsurface Parameter Realization

Introduction

Kelvin I. Amalokwu is an inventor based in Houston, Texas, and is associated with ExxonMobil Technology and Engineering Company. His patent work addresses methods for representing subsurface parameters across depth.

Latest Patents

Amalokwu is named on 1 patent, titled “Methods of Generating a Parameter Realization for a Subsurface Parameter.” The disclosed methods divide a subsurface parameter profile into adjacent stratigraphic units, then split those units into layers. For each layer, the method determines a parameter value range and selects a value within that range. It then generates a parameter realization by assigning the selected value to the corresponding depth range. This approach provides a structured way to represent subsurface properties that vary with depth.

Career Highlights

Amalokwu’s listed patent reflects work at the intersection of subsurface modeling and engineering. The invention focuses on organizing geological units and assigning parameter values to their depth intervals.

Collaborations

His listed coworkers include Brian R. Crawford and Ripudaman Manchanda. The patent information provided identifies Amalokwu’s association with ExxonMobil Technology and Engineering Company.

Conclusion

Kelvin I. Amalokwu’s patent describes a method for generating depth-dependent subsurface parameter realizations by dividing geological profiles into units and layers and assigning values to their corresponding depth ranges.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…