Company Filing History:
2 out of 349 
1 out of 3,975 
Years Active: 1993-1997
Title: Keith E Humenik: Innovator in Industrial Process Monitoring
Introduction
Keith E Humenik is a notable inventor based in Columbia, MD (US). He has made significant contributions to the field of industrial process monitoring, holding a total of 3 patents. His work focuses on developing methods and systems that enhance the efficiency and reliability of industrial processes.
Latest Patents
One of Humenik's latest patents is a system for monitoring an industrial process and determining sensor status. This innovative method includes generating a first and second signal characteristic of an industrial process variable. One of the signals can be an artificial signal generated by an auto regressive moving average technique. After obtaining two signals associated with one physical variable, a difference function is determined by calculating the arithmetic difference between the two pairs of signals over time. A frequency domain transformation is then applied to the difference function to obtain Fourier modes that describe a composite function. Finally, a residual function is derived by subtracting the composite function from the difference function, and this residual function, which is free of nonwhite noise, is analyzed using a statistical probability ratio test.
Career Highlights
Throughout his career, Keith E Humenik has worked with various organizations, including Arch Development Corporation and the United States of America as represented by the United States. His experience in these roles has allowed him to develop and refine his innovative ideas in industrial process monitoring.
Collaborations
Humenik has collaborated with notable individuals such as Kenneth C Gross and Kristin K Hoyer. These partnerships have contributed to the advancement of his projects and the successful implementation of his inventions.
Conclusion
Keith E Humenik is a distinguished inventor whose work in industrial process monitoring has led to valuable innovations. His patents reflect a deep understanding of the complexities involved in monitoring industrial processes, and his collaborations further enhance the impact of his contributions.