Langhorne, PA, United States of America

Keith A Temple

This inventor holds 1 USPTO granted patent. Top assignee: Field Diagnostic Services, Inc.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keith A Temple. Retrieved from https://idiyas.com/inventor/keith-a-temple-6onho4sv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Keith A. Temple: Innovator in Evaporator Airflow Verification

Introduction

Keith A. Temple is a notable inventor based in Langhorne, PA (US). He has made significant contributions to the field of vapor compression cycle equipment. His innovative approach has led to the development of a unique method for determining evaporator airflow verification.

Latest Patents

Keith holds a patent for a "Method for determining evaporator airflow verification." This patent outlines a field test protocol designed to assess the airflow verification of existing vapor compression cycle equipment. His work in this area is crucial for improving the efficiency and reliability of HVAC systems.

Career Highlights

Keith is currently employed at Field Diagnostic Services, Inc. His role involves applying his expertise in airflow verification to enhance the performance of vapor compression systems. With a focus on practical solutions, he has established himself as a valuable asset in his field.

Collaborations

Keith has worked alongside talented colleagues, including Todd M. Rossi and Changlin Sun. Their collaborative efforts contribute to the advancement of technologies in the HVAC industry.

Conclusion

Keith A. Temple's innovative work in evaporator airflow verification showcases his commitment to improving vapor compression cycle equipment. His contributions are vital for the ongoing development of efficient HVAC solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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