Yokohama, Japan

Keita Hayashi

This inventor holds 24 USPTO granted patents and 1 published patent application and 14 EPO patents, primarily in Image Processing Technology. Top assignee: Jvc Kenwood Corporation. Active years: 2020-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keita Hayashi. Retrieved from https://idiyas.com/inventor/keita-hayashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 24 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.9

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2020-2026

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Areas of Expertise:
Image Processing
Recording Apparatus
Object Recognition
Control Method
Abnormality Detection
Earphone System
Non-Transitory Medium
Vehicle Recording
Reproduction Method
Imaging Data
Control Device
Recording Control
24 patents (USPTO):Explore Patents

Title: Keita Hayashi - Innovator from Yokohama, JP

Introduction: Keita Hayashi is a renowned inventor hailing from Yokohama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Keita Hayashi holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his diverse range of expertise and innovative spirit.

Career Highlights: Throughout his career, Keita Hayashi has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Keita Hayashi has collaborated with top research institutions and universities in Japan, fostering a culture of innovation and knowledge-sharing to push the boundaries of technological progress.

Conclusion: Keita Hayashi's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and entrepreneurs in Yokohama and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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