Kanagawa, Japan

Keiki Koike


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Keiki Koike: Innovator in Electronic Component Testing

Introduction

Keiki Koike is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of electronic components, particularly in the area of testing methodologies. His innovative approach has led to the development of a unique electronic component contactor.

Latest Patents

Koike holds a patent for an "Electronic component contactor, apparatus for testing electronic component, and method for testing electronic component." This invention features a design that includes a plurality of contact pins, a housing that encases and positions these pins, and a buffer member that mitigates the behavior of the contact pins. Each contact pin consists of a base portion, a stretch portion that arcs from the base, a contact portion formed in the stretch, and a load receiving portion. The housing is designed with a flat support base that supports the buffer member, which is formed in a sheet-like shape. This innovative design enhances the efficiency and reliability of electronic component testing.

Career Highlights

Keiki Koike is currently employed at Renesas Electronics Corporation, where he continues to push the boundaries of electronic component technology. His work has been instrumental in advancing testing methods that ensure the quality and performance of electronic components.

Collaborations

Throughout his career, Koike has collaborated with esteemed colleagues such as Shigeru Suzuki and Shingo Yanagihara. These partnerships have fostered an environment of innovation and creativity, leading to advancements in electronic component technology.

Conclusion

Keiki Koike's contributions to the field of electronic components and testing methodologies are noteworthy. His innovative patent and collaborative efforts highlight his commitment to advancing technology in this critical area.

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