Wako, Japan

Keiji Maruyama

This inventor holds 2 USPTO granted patents. Top assignee: Honda Giken Kogyo Kabushiki Kaisha. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keiji Maruyama. Retrieved from https://idiyas.com/inventor/keiji-maruyama-cw1k9rd8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 46(Granted Patents)


Company Filing History:


Years Active: 2001

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2 patents (USPTO):Explore Patents

Title: Keiji Maruyama: Innovator in Automotive Labeling Technology

Introduction

Keiji Maruyama is a notable inventor based in Wako, Japan. He has made significant contributions to the field of automotive technology, particularly in labeling systems. With a total of 2 patents to his name, Maruyama continues to push the boundaries of innovation in the automotive industry.

Latest Patents

One of Maruyama's latest patents is a specialized label for automobiles. This innovation aims to enhance the functionality and visibility of vehicle labels, ensuring that important information is easily accessible to users.

Career Highlights

Maruyama is currently employed at Honda Giken Kogyo Kabushiki Kaisha, a leading company in the automotive sector. His work at Honda has allowed him to collaborate with other talented professionals and contribute to groundbreaking projects in vehicle technology.

Collaborations

One of his notable coworkers is Jiro Hamada, with whom he has worked closely on various projects. Their collaboration has led to advancements in automotive labeling solutions, showcasing the importance of teamwork in innovation.

Conclusion

Keiji Maruyama's contributions to automotive labeling technology highlight his role as an influential inventor in the industry. His patents and collaborations reflect a commitment to enhancing vehicle functionality and user experience.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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