Itami, Japan

Keiichi Sawada


Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 42(Granted Patents)


Company Filing History:


Years Active: 1987-1988

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Keiichi Sawada: Innovator in Semiconductor Testing Technology

Introduction

Keiichi Sawada is a prominent inventor based in Itami, Japan. He has made significant contributions to the field of semiconductor testing, holding a total of 2 patents. His work focuses on developing advanced testing devices that enhance the reliability and efficiency of semiconductor devices.

Latest Patents

One of his latest patents is a semiconductor device testing device designed for testing semiconductor devices with input/output terminals. This device includes a dynamic load circuit for each terminal and a comparator that compares the voltage value at the terminal with a predetermined value. This innovation allows for the detection of whether the internal state of the semiconductor device is in a high impedance state. The confirmation of the electrical connection between the semiconductor device and the testing device is conducted by the dynamic load circuit and the comparator.

Another notable patent is a device for testing semiconductor devices that conducts logical verification and electric characteristics measurement. This device features a measuring circuit corresponding to each pin of the semiconductor device, which includes a comparator for comparing the output voltage or current with a reference value. It also incorporates a memory for storing necessary information, a controller for managing the testing process, and a judging circuit to determine the normalcy of the test results.

Career Highlights

Keiichi Sawada is associated with Mitsubishi Electric Corporation, where he has been instrumental in advancing semiconductor testing technologies. His expertise and innovative approach have contributed to the company's reputation as a leader in the electronics industry.

Collaborations

He has collaborated with Tetsuo Tada, a fellow innovator, to further enhance the development of semiconductor testing devices. Their combined efforts have led to significant advancements in the field.

Conclusion

Keiichi Sawada's contributions to semiconductor testing technology exemplify his dedication to innovation and excellence. His patents reflect a commitment to improving the functionality and reliability of semiconductor devices, making a lasting impact in the industry.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…