The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1987
Filed:
May. 06, 1985
Keiichi Sawada, Itami, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A semiconductor device testing device for conducting a logical verification and an electric characteristics measurement of a semiconductor device, includes a measuring circuit provided corresponding to each pin of the semiconductor device to be tested, the measuring circuit including a comparator intended to compare the output voltage or current from the semiconductor device with a referent voltage or current; a memory for storing information required for the logical verification and the electric characteristics measurement; a controller for controlling the execution of the logical verification and the electric characteristics measurement including an application of a reference voltage or current to the comparator; and a judging circuit to determine whether the result of the logical verification or the electric characteristics measurement is normal or abnormal from the output of the comparator.