Tokyo, Japan

Keiichi Nagakusa

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Company. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keiichi Nagakusa. Retrieved from https://idiyas.com/inventor/keiichi-nagakusa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Keiichi Nagakusa: Innovator in Test Head Technology

Introduction

Keiichi Nagakusa is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of test head technology, particularly through his innovative patent. His work is recognized for enhancing the efficiency and functionality of testing mechanisms.

Latest Patents

Nagakusa holds a patent for a "Mechanism for removably mounting DUT board on test head." This invention features a cam mechanism that includes a cam shaft with a guide pin connected to an actuator. The design incorporates a driven ring with a sloped groove, allowing the guide pin to navigate effectively. The mechanism ensures that the DUT board assembly is securely urged against contact probes on the test head assembly, optimizing the testing process.

Career Highlights

Keiichi Nagakusa is associated with Hewlett-Packard Company, where he has applied his expertise in developing advanced testing solutions. His innovative approach has contributed to the company's reputation for quality and reliability in technology.

Collaborations

Throughout his career, Nagakusa has collaborated with esteemed colleagues such as Tetsuya Shiraishi and Takeshi Tamura. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Keiichi Nagakusa's contributions to test head technology exemplify the impact of innovation in the field. His patent and collaborative efforts continue to influence advancements in testing mechanisms.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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