Company Filing History:
Years Active: 2008-2011
Title: Innovations of Keiichi Koyama
Introduction
Keiichi Koyama is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of computer systems, particularly in fault tolerance and multiprocessing technologies. With a total of two patents to his name, Koyama's work has had a considerable impact on the reliability and efficiency of computer systems.
Latest Patents
Koyama's latest patents include a "Symmetric Multiprocessor Fault Tolerant Computer System" and a "Fault Tolerant Computer System." The symmetric multiprocessing fault-tolerant computer system controls memory access in a symmetric multiprocessing environment. It creates virtual page structures that reflect physical page access privileges to shared memory for processors. This innovation ensures coordinated and deterministic shared memory access between processors. The system may utilize duplication or continuous replay to maintain fault tolerance. The second patent, the fault-tolerant computer system, involves at least two servers configured to perform a first set of operations. These servers communicate with a computer that does not perform the same operations. In the event of a component failure, the system determines which server will continue operations based on communication with the computer.
Career Highlights
Koyama is currently employed at Marathon Technologies Corporation, where he continues to develop innovative solutions in computer technology. His work focuses on enhancing the reliability and performance of computer systems, making them more resilient to failures.
Collaborations
Some of Koyama's notable coworkers include Paul A Leveille and Satoshi Watanabe. Their collaborative efforts contribute to the advancement of technology in their field.
Conclusion
Keiichi Koyama's contributions to fault-tolerant computer systems demonstrate his expertise and commitment to innovation. His patents reflect a deep understanding of computer architecture and the importance of reliability in technology.