Kanagawa, Japan

Keigo Ikeda

This inventor holds 1 USPTO granted patent. Top assignee: Sigma Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keigo Ikeda. Retrieved from https://idiyas.com/inventor/keigo-ikeda-920g3jqi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Keigo Ikeda: Innovator in Imaging Optical Systems

Introduction

Keigo Ikeda is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of optical systems, particularly through his innovative designs and patents. His work is recognized for enhancing imaging technology, which is crucial in various applications.

Latest Patents

Keigo Ikeda holds a patent for an imaging optical system. This system includes a first lens group with positive refractive power, a front lens group with negative refractive power, and a rear lens group also with positive refractive power. The design allows for zooming from a wide-angle end to a telephoto end, with specific movements and configurations of the lens groups to achieve optimal imaging results. His patent is a testament to his expertise and creativity in optical engineering, with 1 patent to his name.

Career Highlights

Ikeda is associated with Sigma Corporation, a company known for its high-quality photographic equipment and optical products. His role at Sigma has allowed him to work on advanced imaging technologies, contributing to the company's reputation for innovation in the optical industry.

Collaborations

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Conclusion

Keigo Ikeda's contributions to imaging optical systems exemplify his innovative spirit and technical expertise. His patent reflects a significant advancement in optical technology, showcasing the importance of continuous innovation in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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