Wako, Japan

Kei Taneishi

This inventor holds 1 USPTO granted patent. Top assignees: Riken Corporation, Topcon Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kei Taneishi. Retrieved from https://idiyas.com/inventor/kei-taneishi-xtkatskc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kei Taneishi: Innovator in Medical Systems

Introduction

Kei Taneishi is a notable inventor based in Wako, Japan. He has made significant contributions to the field of medical technology, particularly in the development of systems that integrate ophthalmic and internal medicine data for improved patient diagnostics.

Latest Patents

Taneishi holds a patent for a medical system and method that enhances the diagnostic process. This innovative system includes an ophthalmic data acquiring unit, which utilizes examination apparatuses to gather ophthalmic data from patients. Additionally, it features an internal medicine data acquiring unit that collects internal medicine data. The system employs an inference processor that utilizes machine learning to analyze the data and generate inferred diagnostic results. This integration of data aims to provide more accurate and comprehensive patient assessments.

Career Highlights

Throughout his career, Kei Taneishi has worked with prominent organizations, including Riken Corporation and Topcon Corporation. His experience in these companies has allowed him to develop and refine his innovative ideas in medical technology.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Kei Taneishi's work in medical systems exemplifies the intersection of technology and healthcare, showcasing his commitment to improving patient diagnostics through innovation. His contributions are significant in advancing medical technology and enhancing patient care.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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