Kyoto, Japan

Kei Ogawa

This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Top assignee: Fujitec Co., Ltd.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kei Ogawa. Retrieved from https://idiyas.com/inventor/kei-ogawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Kei Ogawa - Innovator in Elevator Control Technology

Introduction

Kei Ogawa is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of elevator technology, particularly with his innovative designs and solutions. His work has been recognized in the industry, showcasing his expertise and creativity.

Latest Patents

Kei Ogawa holds a patent for an elevator control panel. This invention reflects his commitment to improving the functionality and efficiency of elevator systems. The patent demonstrates his ability to address practical challenges in the industry.

Career Highlights

Throughout his career, Kei Ogawa has worked with prominent companies such as Fujitec Co., Ltd. and Carrier Japan Corporation. His experience in these organizations has allowed him to develop his skills and contribute to various projects in elevator technology.

Collaborations

Kei Ogawa has collaborated with talented individuals in his field, including Kentaro Mikogami and Sumiko Kiriya. These partnerships have enriched his work and fostered innovation in elevator systems.

Conclusion

Kei Ogawa is a distinguished inventor whose contributions to elevator technology have made a lasting impact. His patent for an elevator control panel exemplifies his innovative spirit and dedication to enhancing industry standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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