Numazu, Japan

Kei-ichi Shiokawa

This inventor holds 1 USPTO granted patent. Top assignee: Ricoh Company, Ltd.. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kei-ichi Shiokawa. Retrieved from https://idiyas.com/inventor/kei-ichi-shiokawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Innovations of Kei-ichi Shiokawa

Introduction

Kei-ichi Shiokawa is a notable inventor based in Numazu, Japan. He has made significant contributions to the field of thermal imaging technology. His innovative approach has led to the development of a unique thermal image transfer recording method.

Latest Patents

Shiokawa holds 1 patent for his invention titled "Multiple-use thermal image transfer recording method." This method involves a line thermal head that contacts a multiple-use thermal image transfer recording medium. The medium has a Young's modulus of 1,200 kg/mm² or more in both lengthwise and crosswise directions. The process includes applying thermal energy from the line thermal head to transfer ink components from the ink layer to an image-receiving medium.

Career Highlights

Kei-ichi Shiokawa is associated with Ricoh Company, Ltd., where he has been instrumental in advancing thermal imaging technologies. His work has contributed to the efficiency and effectiveness of thermal image transfer methods.

Collaborations

Shiokawa collaborates with Youji Ide, who is also a key figure in the development of innovative technologies within the company.

Conclusion

Kei-ichi Shiokawa's contributions to thermal imaging technology exemplify the impact of innovation in modern recording methods. His work continues to influence advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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