Kefei Lu

Title: Innovations of Kefei Lu

Introduction

Kefei Lu is an accomplished inventor based in Dix Hills, NY (US). He holds a total of 2 patents that showcase his expertise in imaging technologies and solid object reconstruction.

Latest Patents

One of his latest patents is titled "System and method for imaging and decoding optical codes using at least two different imaging settings." This invention provides a system and method for imaging an optical code by consecutively using at least two different imaging settings. The process involves generating image data sets corresponding to each setting, evaluating them, and selecting the most suitable one based on the evaluation. The system includes an imaging engine with a lens assembly and a photo sensor array, along with a processor for data evaluation.

Another significant patent by Kefei Lu is "Measurement of dimensions of solid objects from two-dimensional image(s)." This invention facilitates the reconstruction of solid objects from two-dimensional images. It allows for the extraction of information from known and regular-shaped objects by measuring distances and estimating scale factors. The device can perform both image capture and distance measurement, enabling effective object identification through various processes.

Career Highlights

Kefei Lu is currently associated with Symbol Technologies, LLC, where he contributes to advancements in imaging and object measurement technologies. His work has significantly impacted the field, leading to innovative solutions that enhance imaging capabilities.

Collaborations

Kefei Lu has collaborated with notable coworkers, including Eugene B Joseph and Edward Douglas Hatton. Their combined expertise has fostered a productive environment for innovation and development.

Conclusion

Kefei Lu's contributions to imaging technologies and solid object reconstruction demonstrate his commitment to innovation. His patents reflect a deep understanding of complex systems and a drive to improve technological solutions.