Oegstgeest, Netherlands

Kees Joost Batenburg

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignees: Cwi, University of Antwerp. Active years: 2016-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kees Joost Batenburg. Retrieved from https://idiyas.com/inventor/kees-joost-batenburg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2016-2017

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2 patents (USPTO):Explore Patents

Title: Kees Joost Batenburg: Innovator in Tomographic Imaging

Introduction

Kees Joost Batenburg is a notable inventor based in Oegstgeest, Netherlands. He has made significant contributions to the field of tomographic imaging, holding 2 patents that enhance the efficiency and effectiveness of imaging techniques. His work focuses on developing methods that improve the quality of tomographic reconstructions.

Latest Patents

Batenburg's latest patents include a "Filter for Tomographic Reconstructions" and "Dynamic Tomography Angle Selection." The first patent describes a method for applying a filter component in analytical tomographic reconstruction techniques, such as filtered backprojection. This method utilizes an algebraic reconstruction algorithm to create spatial representations of a volume of interest from projection data sets. It also incorporates a geometry of the tomographic imaging, allowing for the application of the algorithm to multiple virtual projection data sets. This approach aims to inherit beneficial properties from the algebraic reconstruction algorithm while minimizing computational costs.

The second patent, "Dynamic Tomography Angle Selection," outlines a method for determining projection angles in tomographic imaging. This involves obtaining projection data from a test object and calculating function values for candidate projection angles. The method selects the most informative angle based on these calculations, thereby optimizing the imaging process.

Career Highlights

Throughout his career, Kees Joost Batenburg has worked with esteemed institutions, including the University of Antwerp and Centrum Wiskunde & Informatica (CWI). His research has significantly impacted the field of imaging, particularly in enhancing the accuracy and efficiency of tomographic techniques.

Collaborations

Batenburg has collaborated with notable colleagues such as Jan Sijbers and Linda Plantagie. These partnerships have contributed to the advancement of his research and the development of innovative imaging solutions.

Conclusion

Kees Joost Batenburg is a distinguished inventor whose work in tomographic imaging has led to significant advancements in the field. His patents reflect a commitment to improving imaging techniques, making a lasting impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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