Yongin, South Korea

Kee-Bong Yoon

This inventor holds 1 USPTO granted patent. Top assignees: Chung Ang University Industry Academic Cooperation, Korea Research Institute of Standards and Science. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kee-Bong Yoon. Retrieved from https://idiyas.com/inventor/kee-bong-yoon-hgb9mutp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Kee-Bong Yoon: Innovator in Magnetic Measurement Technology.

Introduction

Kee-Bong Yoon is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of magnetic measurement technology. His work focuses on non-destructive methods for evaluating mechanical properties of materials.

Latest Patents

One of Kee-Bong Yoon's key inventions is a reversible permeability measuring device. This device is designed to measure magnetic characteristics and magnetic flux changes in specimens. It utilizes a magnetic potentiometer and a flux meter to directly measure magnetic field changes at the specimen's surface. This innovation allows for accurate evaluation of material deterioration.

Career Highlights

Throughout his career, Kee-Bong Yoon has worked with esteemed organizations such as the Korea Research Institute of Standards and Science and Chung Ang University Industry Academic Cooperation. His experience in these institutions has contributed to his expertise in the field.

Collaborations

Kee-Bong Yoon has collaborated with notable colleagues, including Kwon Sang Ryu and Soo Young Park. Their joint efforts have further advanced research in magnetic measurement technologies.

Conclusion

Kee-Bong Yoon's innovative work in developing a reversible permeability measuring device showcases his commitment to advancing material evaluation techniques. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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