Kean Loon Khor

Title: Kean Loon Khor: Innovator in IC Testing Technology

Introduction

Kean Loon Khor is a notable inventor based in Singapore, recognized for his contributions to the field of integrated circuit (IC) testing. His innovative approach has led to the development of a unique electrical contact pin that enhances testing efficiency.

Latest Patents

Khor holds a patent for a "Multi-beam cantilever style contact pin for IC testing." This invention features an integral electrical contact pin designed to connect a test terminal of a tester load board with an IC terminal of an IC device, specifically adapted for short test heights. The design includes an upper cantilever arm and a lower cantilever arm connected at the back portion. The upper cantilever arm is capable of moving between a first default position and two additional positions, where it contacts the lower cantilever arm in the second position. A bracket arm extends in the opposite direction from the cantilever arms for engagement with the corresponding socket housing.

Career Highlights

Kean Loon Khor is currently employed at Equiptest Engineering Pte Ltd, where he applies his expertise in electrical engineering and innovation. His work focuses on improving testing methodologies and equipment for IC devices, contributing to advancements in the industry.

Collaborations

Khor collaborates with talented professionals in his field, including Chwee Hoe Ong and Michael Goh. Their combined efforts foster a creative environment that drives innovation and enhances product development.

Conclusion

Kean Loon Khor's contributions to IC testing technology exemplify the impact of innovative thinking in engineering. His patented inventions and collaborative spirit continue to shape the future of testing methodologies in the electronics industry.