Osaka, Japan

Kazutoshi Tatsuta

This inventor holds 1 USPTO granted patent. Top assignee: Keyence Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazutoshi Tatsuta. Retrieved from https://idiyas.com/inventor/kazutoshi-tatsuta

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kazutoshi Tatsuta and Industrial Wireless Systems.

Introduction

Kazutoshi Tatsuta is an inventor based in Osaka, Japan, associated with Keyence Corporation. His work includes an invention for gathering wireless-network status information alongside data from industrial devices.

Latest Patents

The provided information lists one patent for Tatsuta: “Industrial Wireless System, Root Node and Programmable Logic Controller.” The invention enables a first industrial device to collect operational data from a second device over a wireless network formed by a root node and a peripheral wireless node. The root node stores information about its own wireless communications and measurements from the peripheral node in memory accessible to the first device. This allows the first device to retrieve network-status information while collecting data from the second device. Tatsuta is credited with 1 patent.

Career Highlights

Tatsuta is associated with Keyence Corporation, a company known for industrial automation and sensing technologies. The patent described here focuses on combining industrial-device data collection with monitoring of wireless-network conditions.

Collaborations

Tatsuo Sumino and Shinya Takahashi are identified as Tatsuta’s coworkers. The provided information does not specify their roles in the patent.

Conclusion

Kazutoshi Tatsuta’s listed patent addresses a practical industrial-networking challenge by making wireless communication status available alongside device data.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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