Namie, Japan

Kazuo Ohira

This inventor holds 1 USPTO granted patent. Top assignee: Tomy K.k.. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuo Ohira. Retrieved from https://idiyas.com/inventor/kazuo-ohira-hn1o7rpw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Kazuo Ohira: Innovator in Orthodontic Product Marking

Introduction

Kazuo Ohira is a notable inventor from Namie, Japan, recognized for his contributions to orthodontic technology. He has developed a unique method and apparatus for marking orthodontic products, which enhances the precision and efficiency of orthodontic procedures.

Latest Patents

Kazuo Ohira holds a patent for a "Method and apparatus for marking orthodontic products." This innovative method involves coupling the orthodontic product with the anode of a power source, placing an electrolyte in electrical contact with the cathode, and selectively exposing portions of the orthodontic product to be marked to the electrolyte. The apparatus includes a hand marker connected to the cathode, a sponge pad soaked with an electrolyte, and a workplate for holding the orthodontic product, all designed to facilitate accurate marking.

Career Highlights

Throughout his career, Ohira has demonstrated a commitment to advancing orthodontic technology. His work at Tomy K.K. has allowed him to focus on developing practical solutions that address the needs of orthodontic professionals and improve patient outcomes.

Collaborations

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Conclusion

Kazuo Ohira's innovative approach to marking orthodontic products showcases his dedication to improving orthodontic practices. His patent reflects a significant advancement in the field, contributing to more effective orthodontic treatments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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