Hitachi, Japan

Kazuo Moriguti

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuo Moriguti. Retrieved from https://idiyas.com/inventor/kazuo-moriguti

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 72(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Kazuo Moriguti: Innovator in Non-Contact Measurement Technology

Introduction

Kazuo Moriguti is a notable inventor based in Hitachi, Japan. He has made significant contributions to the field of measurement technology, particularly through his innovative methods that enhance precision and efficiency in manufacturing processes.

Latest Patents

Moriguti holds a patent for a "Method of measuring shape of object in non-contacting manner." This invention relates to a method that allows for the measurement of an object's shape without physical contact. The process involves providing reference points on the object, applying a light spot on these points, and using a light spot detecting sensor to determine coordinate values. By comparing these values with design values, the method effectively measures manufacturing errors.

Career Highlights

Kazuo Moriguti has dedicated his career to advancing measurement technologies. His work at Hitachi, Ltd. has positioned him as a key figure in the development of non-contact measurement methods. His innovative approach has not only improved accuracy but also streamlined manufacturing processes.

Collaborations

Moriguti has collaborated with talented coworkers such as Yusuke Takagi and Yoshio Kojima. Their combined expertise has contributed to the successful development of advanced measurement technologies.

Conclusion

Kazuo Moriguti's contributions to non-contact measurement technology exemplify the importance of innovation in manufacturing. His patented methods continue to influence the industry, showcasing the potential for advancements in precision measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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