Kiryu, Japan

Kazunori Ueki

This inventor holds 1 USPTO granted patent. Top assignee: Sanyo Electric Co., Ltd.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazunori Ueki. Retrieved from https://idiyas.com/inventor/kazunori-ueki-25218934

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2006

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kazunori Ueki: Innovator in Optical Recording Technology

Introduction

Kazunori Ueki is a notable inventor based in Kiryu, Japan. He has made significant contributions to the field of optical recording technology. His innovative work has led to the development of a unique optical recording apparatus that enhances the efficiency of data reading on signal recording mediums.

Latest Patents

Kazunori Ueki holds a patent for an "Optical recording apparatus and control method thereof." This invention features an optical system that forms a main spot and sub-spots on a signal recording medium. The design allows the sub-spot to be shifted from the main spot in a specific direction, enabling effective reading of recorded signals.

Career Highlights

Ueki is associated with Sanyo Electric Co., Ltd., where he has been instrumental in advancing optical technologies. His work has not only contributed to the company's portfolio but has also impacted the broader field of optical recording.

Collaborations

Ueki has collaborated with notable colleagues such as Tadashi Iwama and Michiyoshi Sawada. Their combined expertise has fostered innovation and development in their respective projects.

Conclusion

Kazunori Ueki's contributions to optical recording technology exemplify the spirit of innovation. His patent and collaborative efforts continue to influence advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…