Ritto, Japan

Kazunari Izawa

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Heavy Industries Machines Tool Co., Ltd.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazunari Izawa. Retrieved from https://idiyas.com/inventor/kazunari-izawa-ifewufd3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Kazunari Izawa: Innovator in Rotation Angle Detection

Introduction

Kazunari Izawa is a notable inventor based in Ritto, Japan. He has made significant contributions to the field of engineering, particularly in the development of rotation angle detection technology. His innovative work has led to the creation of a patent that enhances the functionality of various machines.

Latest Patents

Kazunari Izawa holds a patent for a "Stator electrode for rotation angle detector." This invention is crucial for improving the accuracy and efficiency of rotation angle detection systems. His patent portfolio includes 1 patent, showcasing his focused expertise in this specialized area.

Career Highlights

Izawa is currently employed at Mitsubishi Heavy Industries Machine Tool Co., Ltd. His role at this prestigious company allows him to work on cutting-edge technologies and contribute to advancements in machine tools and industrial equipment.

Collaborations

Throughout his career, Kazunari has collaborated with talented individuals such as Katsuyoshi Takeuchi and Koh Ishii. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Kazunari Izawa's contributions to the field of rotation angle detection exemplify the impact of dedicated inventors in advancing technology. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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