This inventor holds 1 USPTO granted patent. Top assignees: Chiba University, Tosoh Corporation. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2022
Title: Kazuki Iijima: Innovator in Particle Detection Technology
Introduction
Kazuki Iijima is a notable inventor based in Ayase, Japan. He has made significant contributions to the field of particle detection technology. His innovative work focuses on developing methods and devices that enhance the detection of various particles.
Latest Patents
Kazuki Iijima holds a patent for a "Particle detection device and particle detection method." The objective of this invention is to provide a device and method that can individually and continuously detect a wide range of particles. The device includes a particle separation channel that separates particles according to their sizes in a perpendicular direction to the fluid flow. Additionally, it features two or more particle recovery channels connected to the separation channel, each equipped with a particle detection unit that includes an aperture and an electric detector. This invention represents a significant advancement in particle detection technology.
Career Highlights
Throughout his career, Kazuki Iijima has worked with reputable organizations such as Tosoh Corporation and Chiba University. His experience in these institutions has allowed him to refine his skills and contribute to groundbreaking research in particle detection.
Collaborations
Kazuki Iijima has collaborated with esteemed colleagues, including Toshinobu Toyoshima and Kotohiro Furukawa. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Kazuki Iijima's work in particle detection technology showcases his dedication to innovation and research. His contributions have the potential to impact various industries that rely on precise particle detection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile