Minamikoma-gun, Japan

Kazuhisa Motizuki

This inventor holds 1 USPTO granted patent. Top assignee: Nisca Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuhisa Motizuki. Retrieved from https://idiyas.com/inventor/kazuhisa-motizuki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Kazuhisa Motizuki: Innovator in Image Reading Technology.

Introduction

Kazuhisa Motizuki is a notable inventor based in Minamikoma-gun, Japan. He has made significant contributions to the field of image reading technology. His innovative approach has led to the development of a unique image reading apparatus that enhances the efficiency and accuracy of document processing.

Latest Patents

Kazuhisa Motizuki holds a patent for an image reading apparatus. This apparatus is equipped with an image reading unit that is designed to prevent mispositioning or misalignment of the reading line. The configuration includes a document feeder with conveyance paths leading from a sheet supply tray to a discharge tray, ensuring seamless operation.

Career Highlights

Motizuki is associated with Nisca Corporation, where he has been instrumental in advancing imaging technology. His work has been recognized for its practical applications in various industries, particularly in document management and processing.

Collaborations

He has collaborated with notable colleagues such as Osamu Jinza and Seiji Nishizawa. Their combined expertise has contributed to the successful development of innovative solutions in the field.

Conclusion

Kazuhisa Motizuki's contributions to image reading technology exemplify the impact of innovation in enhancing operational efficiency. His patent reflects a commitment to solving practical challenges in document processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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