Kazo, Japan

Kazuhiro Yamashita


Average Co-Inventor Count = 1.3

ph-index = 3

Forward Citations = 25(Granted Patents)


Location History:

  • Kazo, JP (1995 - 1996)
  • Sugito-machi, JP (2002)

Company Filing History:


Years Active: 1995-2002

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3 patents (USPTO):Explore Patents

Title: Kazuhiro Yamashita: Innovator in Semiconductor Testing Technology

Introduction

Kazuhiro Yamashita is a prominent inventor based in Kazo, Japan. He has made significant contributions to the field of semiconductor testing, holding a total of 3 patents. His work focuses on enhancing the efficiency and effectiveness of semiconductor devices.

Latest Patents

Yamashita's latest patents include a semiconductor test system designed for efficiently testing a semiconductor device with a phase lock loop (PLL) circuit. This innovative system features a first clock and waveform generator that supplies a clock signal to the PLL circuit at the start of the first pattern block. Additionally, it includes a second clock and waveform generator that provides pattern data to the device under test (DUT) during each pattern block. The system ensures that the clock signal is continuously provided to the PLL circuit until the end of the last pattern block, while resetting the pattern data between blocks.

Another notable patent is the semiconductor IC tester, which is capable of conducting a double-speed test for an IC device under test. This tester allows for the application of test patterns and comparison of resulting signals in both halves of the test cycle without sacrificing the number of test pins. The double-speed mode effectively doubles the generating speed of test patterns, enhancing the testing process for IC devices.

Career Highlights

Kazuhiro Yamashita is currently employed at Adv Antest Corporation, where he continues to develop innovative testing solutions for semiconductor technology. His expertise in this field has positioned him as a key figure in advancing semiconductor testing methodologies.

Collaborations

Yamashita has collaborated with notable colleagues, including Toshiyuki Negishi and Masatoshi Sato. Their combined efforts contribute to the ongoing development of cutting-edge technologies in semiconductor testing.

Conclusion

Kazuhiro Yamashita's contributions to semiconductor testing technology are noteworthy and impactful. His innovative patents and career at Adv Antest Corporation highlight his dedication to improving the efficiency of semiconductor devices.

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