This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Kazuhiro Nojiri: Innovator in Thickness Measurement Technology
Introduction
Kazuhiro Nojiri is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement technology, particularly in the development of devices that enhance the accuracy and efficiency of thickness measurements.
Latest Patents
Kazuhiro Nojiri holds a patent for a "Thickness measuring device for cylindrical tank bottom plate." This innovative device features plural auxiliary carts that are connected to a measuring cart, which travels across a tank bottom plate through universal joint mechanisms. The device is equipped with reflection-type ultrasonic probes and coating film thickness gauges on the respective auxiliary carts. Additionally, a rotary encoder measures the traveling distance of the measuring cart. The system calculates the actual thickness of the tank bottom plate by subtracting the thickness of the coating film at a specific position, as measured by the rotary encoder. The results are displayed on a screen, providing a comprehensive overview of the thickness across the tank bottom plate.
Career Highlights
Throughout his career, Kazuhiro Nojiri has demonstrated a commitment to innovation and precision in measurement technology. His work has led to advancements that benefit various industries, particularly those involving cylindrical tanks.
Collaborations
Kazuhiro Nojiri has collaborated with notable colleagues, including Fuminori Kiyota and Yuji Nishimura. Their combined expertise has contributed to the successful development of advanced measurement technologies.
Conclusion
Kazuhiro Nojiri's contributions to thickness measurement technology exemplify the impact of innovative thinking in engineering. His patented device represents a significant advancement in the field, showcasing his dedication to improving measurement accuracy and efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile