Yokohama, Japan

Kazuhikde Sigiyama

This inventor holds 1 USPTO granted patent. Top assignee: Canon Denshi Kabushiki Kaisha. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuhikde Sigiyama. Retrieved from https://idiyas.com/inventor/kazuhikde-sigiyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2007

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kazuhikde Sigiyama: Innovator in Document Scanning Technology

Introduction

Kazuhikde Sigiyama is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of document scanning technology. His innovative work has led to the development of a patent that enhances the efficiency and functionality of document scanners.

Latest Patents

Kazuhikde Sigiyama holds a patent for a document scanner. This invention showcases his ability to create solutions that meet the evolving needs of users in the digital age. The patent reflects his commitment to advancing technology in the field of document management.

Career Highlights

Kazuhikde Sigiyama is currently employed at Canon Denshi Kabushiki Kaisha, a leading company in imaging and printing technology. His role at Canon has allowed him to work on cutting-edge projects that push the boundaries of what is possible in document scanning.

Collaborations

Throughout his career, Kazuhikde has collaborated with talented individuals such as Teruhiko Kitamura and Minoru Sashida. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Kazuhikde Sigiyama is a prominent figure in the realm of document scanning technology. His contributions through patents and collaborations highlight his dedication to innovation. His work continues to influence the industry and improve the way we manage documents.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…