Katsumi Fujihara

Title: Innovations of Katsumi Fujihara

Introduction

Katsumi Fujihara is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of surface defect inspection and measurement technologies. With a total of four patents to his name, Fujihara's work has advanced the capabilities of various measurement and inspection apparatuses.

Latest Patents

Fujihara's latest patents include a surface defect inspection apparatus and a surface defect inspection method. The surface defect inspection apparatus features a light source that emits light to a first position on a surface of a target at an angle inclined with respect to the surface. It includes a first photodetector that detects first reflected light from the light source, and a second photodetector that detects second reflected light, which is reflected at a second position closer to the light source. A determining unit assesses whether foreign matter is present on the surface based on the detection results from both photodetectors. Another significant patent is a measurement apparatus that utilizes a measurement light source to emit light, with a projection unit for reflecting light from a mirror plane. This apparatus allows for the measurement of the deflection characteristics of a mirror system with high accuracy and speed.

Career Highlights

Fujihara has worked with prominent companies such as Fujitsu Corporation and A. Aoki & Associates. His experience in these organizations has contributed to his expertise in developing innovative technologies.

Collaborations

Some of his notable coworkers include Kikuo Mita and Masayuki Oyama. Their collaboration has likely fostered an environment of innovation and creativity in their respective projects.

Conclusion

Katsumi Fujihara's contributions to the field of technology through his patents and career experiences highlight his role as a significant inventor. His work continues to influence advancements in surface defect inspection and measurement methodologies.