Osaka, Japan

Katsuhisa Hamano

This inventor holds 1 USPTO granted patent. Top assignee: Nitto-Denko Corporation. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Katsuhisa Hamano. Retrieved from https://idiyas.com/inventor/katsuhisa-hamano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Innovations of Katsuhisa Hamano in Heat-Sensitive Recording Technology.

Introduction

Katsuhisa Hamano is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of heat-sensitive recording technology. His innovative work has led to the development of a unique reversible heat-sensitive recording composition.

Latest Patents

Hamano holds a patent for a reversible heat-sensitive recording composition. This composition is capable of repeatedly writing and erasing information. It includes a leuco compound as a coloring agent and a pyridine derivative with specific substituents, such as a carboxyl group and a phenolic hydroxyl group. This invention enhances the functionality and versatility of heat-sensitive recording sheets.

Career Highlights

Katsuhisa Hamano is associated with Nitto-Denko Corporation, a leading company in the field of advanced materials and technologies. His work at the company has been instrumental in pushing the boundaries of heat-sensitive recording solutions.

Collaborations

Hamano has collaborated with Yutaka Nakabayashi, contributing to the advancement of their shared projects in heat-sensitive technologies.

Conclusion

Katsuhisa Hamano's innovative contributions to heat-sensitive recording technology exemplify the impact of dedicated inventors in advancing modern materials. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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