Company Filing History:
Years Active: 2013
Title: Katsuhiro Gunji: Innovator in Semiconductor Testing Technologies
Introduction
Katsuhiro Gunji is a notable inventor based in Miyazaki, Japan. He has made significant contributions to the field of semiconductor testing, holding a total of 2 patents. His work focuses on improving the efficiency and accuracy of testing semiconductor integrated circuits.
Latest Patents
Gunji's latest patents include a probe card maintenance method and an apparatus for testing semiconductor devices. The probe card maintenance method allows for the accurate, rapid, and easy maintenance of a probe card, which is essential for testing the electrical properties of semiconductor integrated circuits. This method involves heating the probe card and its probes to the same temperature as the test temperature, ensuring optimal performance during testing.
The second patent, an apparatus for testing semiconductor devices, features a test head and a probe card holder that efficiently heats the probe card. This innovation reduces both test time and costs, making it a valuable advancement in semiconductor testing technology.
Career Highlights
Katsuhiro Gunji is associated with Oki Semiconductor Co., Ltd., where he has been instrumental in developing cutting-edge technologies for semiconductor testing. His expertise in this area has positioned him as a key figure in the industry.
Collaborations
Gunji has worked alongside talented colleagues such as Toru Iwasaki and Tatsurou Nagai. Their collaborative efforts have contributed to the advancements in semiconductor testing technologies.
Conclusion
Katsuhiro Gunji's innovative work in semiconductor testing has led to significant improvements in the efficiency and accuracy of testing methods. His contributions continue to impact the industry positively, showcasing the importance of innovation in technology.