The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2013
Filed:
Feb. 01, 2010
Katsuhiro Gunji, Miyazaki, JP;
Toru Iwasaki, Miyazaki, JP;
Tatsurou Nagai, Miyazaki, JP;
Yumi Kodama, Miyazaki, JP;
Katsuhiro Gunji, Miyazaki, JP;
Toru Iwasaki, Miyazaki, JP;
Tatsurou Nagai, Miyazaki, JP;
Yumi Kodama, Miyazaki, JP;
Oki Semiconductor Co., Ltd., Tokyo, JP;
Abstract
An improved probe card maintenance method is capable of accurately, rapidly, and easily performing the maintenance of a probe card. The probe card is a jig adapted to test the electrical properties of semiconductor integrated circuits. The electrical properties of the semiconductor integrated circuits are tested at a predetermined test temperature. The probe card has a plurality of probes thereon. The probe card maintenance method includes heating the probe card and the probes on the probe card to the same temperature as the test temperature. The method also includes adjusting positions and postures of the defective probes while maintaining the temperature of the probe card and the probes at the test temperature.