This inventor holds 1 USPTO granted patent. Top assignee: Surface Tensiometry, Inc.. Active years: 2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000
Title: Katsuhiko Fujio: Innovator in Surface Tensiometry
Introduction
Katsuhiko Fujio is a notable inventor based in Matsumoto, Japan. He has made significant contributions to the field of surface tension measurement. His innovative approach has led to the development of a unique method and apparatus that enhances the accuracy of surface tension measurements.
Latest Patents
Katsuhiko Fujio holds a patent for a "Method and apparatus to measure surface tension by inverted vertical pull." This invention presents a method for determining the surface tension of a liquid or the interfacial tension between two dissimilar liquids. The technique utilizes a rigidly suspended probe with small sample sizes, measuring the probe force with a top-loading balance. This method allows for precise measurements by overcoming capillary action, which can affect the results when using small containers.
Career Highlights
Fujio's career is marked by his dedication to advancing the science of surface tension measurement. His work at Surface Tensiometry, Inc. has positioned him as a leader in this specialized field. His innovative methods have paved the way for more accurate and efficient testing processes in various applications.
Collaborations
Katsuhiko Fujio has collaborated with esteemed colleagues such as Edwin E. Tucker and John F. Scamehorn. These partnerships have further enriched his research and development efforts, contributing to the advancement of surface tension measurement technologies.
Conclusion
Katsuhiko Fujio's contributions to the field of surface tension measurement are invaluable. His innovative methods and collaborative efforts continue to influence the industry positively. His work exemplifies the spirit of innovation that drives scientific progress.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile