Yokohama, Japan

Katsuharu Iwamoto

This inventor holds 4 USPTO granted patents. Top assignee: Kabushiki Kaisha Toshiba. Active years: 1987-1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Katsuharu Iwamoto. Retrieved from https://idiyas.com/inventor/katsuharu-iwamoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.9

ph-index = 3

Forward Citations = 37(Granted Patents)


Location History:

  • Kanagawa, JP (1991)
  • Yokohama, JP (1987 - 1993)

Company Filing History:


Years Active: 1987-1993

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4 patents (USPTO):Explore Patents

Title: Innovations by Katsuharu Iwamoto

Introduction

Katsuharu Iwamoto is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of optical measurement technology. With a total of 4 patents to his name, Iwamoto's work has advanced the capabilities of various measurement systems.

Latest Patents

One of his latest inventions is the Laser Doppler Velocimeter. This device utilizes a semiconductor laser as a light source to receive scattered light from natural particulates in a fluid. It processes the Doppler signal to determine the velocity of the fluid being measured. Another significant invention is the Wide Range Fiber Optical Displacement Sensor. This sensor is designed to measure a broader range of distances and displacements, utilizing a combination of projection and reference beams for accurate measurements.

Career Highlights

Iwamoto is currently employed at Kabushiki Kaisha Toshiba, where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the precision and reliability of optical measurement devices.

Collaborations

Iwamoto collaborates with Hideo Miyagawa, contributing to the advancement of their projects and sharing expertise in their respective fields.

Conclusion

Katsuharu Iwamoto's contributions to optical measurement technology through his patents reflect his dedication to innovation. His work continues to influence the industry and improve measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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