The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1987
Filed:
Oct. 23, 1985
Katsuharu Iwamoto, Yokohama, JP;
Osamu Kawakami, Yokosuka, JP;
Hideo Miyagawa, Yokohama, JP;
Ikuo Tashiro, Yokohama, JP;
Takiji Ishimura, Yokohama, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A pressure measuring system wherein light is transmitted from a light source via a first optical fiber to a pressure-receiving diaphragm having a reflecting surface which undergoes a deflection in relation to the pressure being measured. The diaphragm reflects light transmitted thereto to a second optical fiber which transmits the reflected light to a first photosensitive element. A reference optical fiber is arranged approximately coextensive to the first and second optical fibers and transmits light from the light source in round trip fashion along substantially the same path as light transmitted by the first and second optical fibers to a second photosensitive element. The photosensitive elements produce respective electrical signals which are applied to an operational circuit which eliminates variations in the amount of light due to external disturbances by dividing one electrical signal by the other. With such a construction, it is possible to have a pressure measuring system which is unaffected by electromagnetic induction accompanying large currents and high voltages, which enables more accurate and more sensitive pressure measurements.