Overland Park, KS, United States of America

Katrina E Kruger

This inventor holds 1 USPTO granted patent. Top assignee: Sprint Communications Comapny L.p.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Katrina E Kruger. Retrieved from https://idiyas.com/inventor/katrina-e-kruger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 67(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Katrina E. Kruger

Introduction

Katrina E. Kruger is a notable inventor based in Overland Park, KS (US). She has made significant contributions to the field of electronic device auditing. With a focus on enhancing the accuracy and reliability of electronic device shipments, her work has implications for various industries.

Latest Patents

Katrina holds a patent for a method titled "Auditing of electronic device and packaging." This innovative method involves electronically reading serial numbers on electronic devices and their packaging. It also includes comparing these serial numbers with stored data to ensure accuracy. The process further incorporates software version identity checks, automatically notifying users of any discrepancies.

Career Highlights

Katrina is currently employed at Sprint Communications Company L.P., where she applies her expertise in electronic device auditing. Her work contributes to the company's commitment to quality and reliability in electronic communications.

Collaborations

Katrina collaborates with talented individuals such as Laura M. Bonar and Sanjay Kumar Sharma. Together, they work on advancing technologies that improve electronic device management and auditing processes.

Conclusion

Katrina E. Kruger exemplifies innovation in the field of electronic device auditing. Her contributions not only enhance operational efficiency but also ensure the integrity of electronic device shipments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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