Budapest, Hungary

Katalin Erdelyi

This inventor holds 1 USPTO granted patent. Top assignee: Magyar Tudomanyos Akademia Muszaki Fizikai Kutato Intezete. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Katalin Erdelyi. Retrieved from https://idiyas.com/inventor/katalin-erdelyi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Katalin Erdelyi: Innovator in Layer Thickness Measurement

Introduction: Katalin Erdelyi is a notable inventor based in Budapest, Hungary. With a focus on advancing scientific methodologies, she has made significant contributions within the realm of physics and engineering.

Latest Patents: Katalin holds a patent for a "Method and apparatus for determining the layer thickness of." This innovative approach offers new possibilities for measurements in various scientific applications.

Career Highlights: Currently, Katalin is employed at the Research Institute for Technical Physics and Material Science of the Hungarian Academy of Sciences. Her work focuses on developing advanced measurement techniques that have practical implications in research and industry.

Collaborations: Katalin collaborates with esteemed colleagues Gyorgy Ferenczi and Maria Somogyi, leveraging their combined expertise to push the boundaries of scientific understanding and innovation.

Conclusion: Katalin Erdelyi's contributions to the field of measurement technology exemplify the importance of innovation in scientific research. Her patent and collaborations highlight her commitment to enhancing methodologies critical to various applications, further establishing her as an influential figure in her domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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