Mountain View, CA, United States of America

Karthik Vijayraghavan

USPTO Granted Patents = 1 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations in Atomic-Force Microscopy: The Contributions of Karthik Vijayraghavan

Introduction: Karthik Vijayraghavan is an accomplished inventor based in Mountain View, California. He has made significant strides in the field of atomic-force microscopy (AFM), particularly with a focus on enhancing the sensitivity and performance of AFM probes. His innovative work is exemplified by a unique patent that showcases his dedication to advancing scientific research.

Latest Patents: Karthik holds a patent for an "Interferometric Atomic-Force Microscopy Device and Method." This invention presents a high-bandwidth AFM probe characterized by a diffraction grating that exhibits a monotonically changing diffraction characteristic along its length. This design allows the AFM probes to perform with high sensitivity across a wide range of operational conditions, including varying operating wavelengths and measurement media. Furthermore, the patented method enables the estimation of a physical property of a surface based on high-frequency signal components from the AFM probe's output. This innovation facilitates the determination of tip-surface interaction forces by analyzing the relationship between the motion of the probe base and the probe tip.

Career Highlights: Karthik Vijayraghavan is associated with Leland Stanford Junior University, where he contributes to cutting-edge research and development in the field of AFM and related technologies. His contributions have been pivotal in enhancing the capabilities of AFM devices for scientific applications.

Collaborations: Karthik collaborates closely with esteemed colleagues, including Antonio A Gellineau and Olav Solgaard. Their joint efforts drive forward innovative solutions in microscopy and material science, reflecting a strong commitment to advancing technological frontiers.

Conclusion: Karthik Vijayraghavan stands out as a key inventor in the realm of atomic-force microscopy. With a notable patent that enhances AFM performance, his work at Leland Stanford Junior University demonstrates the impactful role of innovation in scientific research. Through collaborations with fellow experts, Karthik continues to contribute to the evolution of microscopy technology, paving the way for future discoveries.

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