Kanata, Canada

Kartavya Soni

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Cisco Technology, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kartavya Soni. Retrieved from https://idiyas.com/inventor/kartavya-soni

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kartavya Soni: Inventor in Observability Visualization

Introduction

Kartavya Soni is an inventor based in Kanata, Canada. His patent work includes techniques for presenting metrics and logs together to help users examine events associated with monitored systems.

Latest Patents

Soni is associated with one patent, titled “Techniques for Metric and Logs Visualization.” The invention describes receiving event logs from a monitored system and a metric with related data from another system. It identifies log events corresponding to the metric and displays both the metric information and relevant events in separate sections of a dashboard, concurrently. The dashboard can then be shown on a display device. This approach is designed to make related observability information easier to view together.

Career Highlights

Soni is associated with Cisco Technology, Inc. His patent reflects work on dashboard techniques for connecting metrics with relevant log events.

Collaborations

Soni’s listed coworker is Daniel Kent Ferguson. The available information identifies this professional association but does not specify further details about their collaboration.

Conclusion

Kartavya Soni’s patent focuses on bringing metrics and related log events into a shared dashboard, supporting a more integrated view of system observability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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