This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Berthold Detection Systems Gmbh. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: Karsten Stein - Innovator in Photometric Analysis
Introduction
Karsten Stein is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of photometric analysis, particularly through his innovative device designed for analyzing liquid samples. His work exemplifies the intersection of technology and scientific inquiry.
Latest Patents
Karsten Stein holds a patent for a "Device for photometric analysis of a liquid sample and sample carrier therefor." This invention relates to a device that utilizes light to analyze liquid samples. It features a transparent sample carrier and a movable upper mirror that can transition between a closed position, which encloses a measurement space, and an open position for sample application. The device also includes a beam path that guides measurement light at an oblique angle of incidence through the sample carrier to the upper mirror, enhancing the accuracy of the analysis.
Career Highlights
Karsten Stein is associated with Berthold Detection Systems GmbH, where he applies his expertise in photometric analysis. His role at the company allows him to further develop and refine his inventions, contributing to advancements in measurement technology.
Collaborations
Some of his notable coworkers include Lutz Pfeifer and Berthold Breitkopf. Their collaboration fosters an environment of innovation and shared knowledge, enhancing the development of cutting-edge technologies in their field.
Conclusion
Karsten Stein's contributions to photometric analysis through his patented device highlight his role as an innovator in the scientific community. His work continues to influence the methods used in liquid sample analysis, showcasing the importance of innovation in technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile