Bleckede, Germany

Karsten Hofman

This inventor holds 1 USPTO granted patent. Top assignee: Lap Gmbh Laser Applikationen. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Karsten Hofman. Retrieved from https://idiyas.com/inventor/karsten-hofman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Innovations by Karsten Hofman

Introduction

Karsten Hofman is a notable inventor based in Bleckede, Germany. He has made significant contributions to the field of measurement technology, particularly in the context of elongate workpieces. His innovative approach has led to the development of a unique apparatus that enhances the accuracy of measurements in industrial applications.

Latest Patents

Karsten Hofman holds a patent for an "Apparatus for process for measuring the thickness and out-of-roundness of elongate workpieces." This invention addresses the need for reliable measurement of diameter and out-of-roundness in round products that are advanced in their longitudinal direction within rolling mill trains. The apparatus utilizes three or more laser triangulation devices to measure the distance from the workpiece surface. The lasers are directed to a common point of intersection that corresponds to the workpiece center, ensuring precise measurements.

Career Highlights

Karsten Hofman is associated with Lap GmbH Laser Applikationen, a company that specializes in laser applications. His work at this company has allowed him to focus on developing advanced measurement technologies that are crucial for various industrial processes. His patent reflects his commitment to improving measurement accuracy and efficiency in manufacturing.

Conclusion

Karsten Hofman's contributions to measurement technology through his innovative patent demonstrate his expertise and dedication to advancing industrial applications. His work continues to influence the field, providing solutions that enhance precision in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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