Karre M Greene

Title: Karre M Greene: Innovator in Integrated Circuit Testing

Introduction

Karre M Greene is a notable inventor based in Essex Junction, VT (US). She has made significant contributions to the field of integrated circuit testing, particularly through her innovative patent that addresses low-voltage current measurements.

Latest Patents

Karre holds a patent for a system and method using low voltage current measurements to measure voltage network currents in an integrated circuit (IC). The patent, titled "Low-voltage IC test for defect screening," outlines a process where a low voltage current leakage test is applied to voltage networks for the IC or microchip via one or more IC chip connectors. This method involves developing specifications based on the chip's circuit delay, allowing for the sorting of chips into reliability categories based on their performance during testing. The process includes a high voltage stress test followed by a second low voltage current leakage test, which helps identify defects that may affect the chip's reliability.

Career Highlights

Karre is currently employed at Globalfoundries Inc., where she continues to advance her work in integrated circuit technology. Her innovative approach to testing has the potential to enhance the reliability and performance of microchips in various applications.

Collaborations

Karre has collaborated with notable colleagues, including Daniel J Poindexter and James M Crafts, contributing to a dynamic work environment that fosters innovation and excellence in technology.

Conclusion

Karre M Greene's contributions to integrated circuit testing exemplify her commitment to innovation in the field. Her patent reflects a significant advancement in the reliability assessment of microchips, showcasing her expertise and dedication to improving technology.