Santa Fe, NM, United States of America

Karl K Jonietz

This inventor holds 2 USPTO granted patents. Top assignee: Los Alamos National Security, LLC. Active years: 2011-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Karl K Jonietz. Retrieved from https://idiyas.com/inventor/karl-k-jonietz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 41(Granted Patents)


Company Filing History:


Years Active: 2011-2013

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2 patents (USPTO):Explore Patents

Title: The Innovations of Karl K. Jonietz

Introduction

Karl K. Jonietz is an accomplished inventor based in Santa Fe, NM (US). He has made significant contributions to the field of leak detection through his innovative patents. With a total of 2 patents, Jonietz continues to push the boundaries of technology in his area of expertise.

Latest Patents

Jonietz's latest patents include a unique coating designed for leak detection. This innovative coating serves as a method to detect fluid leaks effectively. The application of this technology has the potential to enhance safety and efficiency in various industries.

Career Highlights

Karl K. Jonietz is currently employed at Los Alamos National Security, LLC. His work at this esteemed organization allows him to collaborate with some of the brightest minds in the field. His contributions have been instrumental in advancing leak detection technologies.

Collaborations

Some of Jonietz's notable coworkers include David Lincoln Thorn and James M. Boncella. Their collaborative efforts have fostered an environment of innovation and creativity, leading to groundbreaking advancements in their respective fields.

Conclusion

Karl K. Jonietz exemplifies the spirit of innovation through his patents and contributions to leak detection technology. His work at Los Alamos National Security, LLC highlights his commitment to advancing safety and efficiency in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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