Jena, Germany

Karl-Heinz Klopfleisch

This inventor holds 3 USPTO granted patents. Top assignees: Carl Zeiss Jena Gmbh, Carl Zeiss Microimaging Gmbh. Active years: 2005-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Karl-Heinz Klopfleisch. Retrieved from https://idiyas.com/inventor/karl-heinz-klopfleisch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.7

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2005-2008

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3 patents (USPTO):Explore Patents

Title: The Innovations of Karl-Heinz Klopfleisch

Introduction

Karl-Heinz Klopfleisch is a notable inventor based in Jena, Germany. He has made significant contributions to the field of laser scanning microscopy. With a total of 3 patents, his work has advanced the technology used in this specialized area.

Latest Patents

One of his latest patents is an installable pinhole that is adjustable for the illumination and detection beam paths of a laser scanning microscope. This innovative design features foil edges that can be adjusted relative to one another. The pinhole is defined by at least two foils, each with at least one straight edge, arranged in such a way that their edges form an L-shape. The L-shaped connection pieces are positioned to define a rhombic or square light passage, allowing for precise adjustments of the pinhole.

Career Highlights

Throughout his career, Karl-Heinz Klopfleisch has worked with prominent companies such as Carl Zeiss Jena GmbH and Carl Zeiss Microimaging GmbH. His experience in these organizations has contributed to his expertise in optical technologies and innovations.

Collaborations

He has collaborated with notable coworkers, including Karlheinz Bartzke and Ralf Wolleschensky. Their joint efforts have furthered advancements in their respective fields.

Conclusion

Karl-Heinz Klopfleisch's contributions to laser scanning microscopy through his innovative patents and collaborations highlight his importance in the field of optical technology. His work continues to influence advancements in microscopy and related technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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