Company Filing History:
Years Active: 2004
Title: Karl-Heinz Irmer: Innovator in Optical Inspection Technology
Introduction
Karl-Heinz Irmer is a notable inventor based in Jena, Germany. He has made significant contributions to the field of optical inspection and measurement, particularly in the area of thin films and substrates. His innovative work has led to the development of a patented method and apparatus that enhances user guidance during optical inspections.
Latest Patents
Irmer holds a patent for a "Method and apparatus for user guidance in optical inspection and measurement of thin films and substrates, and software therefore." This invention provides a comprehensive solution for guiding users during the optical inspection and measurement of both coated and non-coated substrates. The optical measurement system features an integrated recipe and data browser with sortable functionalities, which greatly facilitates the inspection process for users.
Career Highlights
Karl-Heinz Irmer is associated with Leica Microsystems Jena GmbH, where he applies his expertise in optical measurement technologies. His work at the company has been instrumental in advancing the capabilities of optical inspection systems. With a focus on user-friendly solutions, Irmer continues to push the boundaries of innovation in his field.
Collaborations
Irmer collaborates with Matthias Slodowski, a fellow professional in the industry. Their partnership exemplifies the importance of teamwork in driving technological advancements.
Conclusion
Karl-Heinz Irmer's contributions to optical inspection technology reflect his commitment to innovation and user-centric design. His patented methods and apparatus are paving the way for more efficient and effective optical measurement processes.