Yokohama, Japan

Kaoru Miyoshi

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kaoru Miyoshi. Retrieved from https://idiyas.com/inventor/kaoru-miyoshi-av5fvuwx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Inventor Spotlight: Kaoru Miyoshi

Introduction

Kaoru Miyoshi is a distinguished inventor based in Yokohama, Japan. With a focus on innovative measurement techniques, he has made significant contributions to his field through his work in advanced technologies.

Latest Patents

Miyoshi holds a notable patent titled "Method and apparatus for measuring the size of wire rod with laser beam." This invention presents an efficient approach to accurately measure the size of a wire rod. The method involves turning a laser beam into a parallel beam for scanning, positioning a first wire rod of unknown size alongside a second wire rod of a known size, and analyzing the electrical output signals generated as the laser beam passes through both rods to determine the size of the first wire rod.

Career Highlights

Kaoru Miyoshi is currently employed at Hitachi, Ltd., a leading company in technology and innovation. His work there showcases his commitment to advancing measurement technology and enhancing industrial processes.

Collaborations

Miyoshi has collaborated with esteemed colleagues such as Toru Ueno and Youichi Fukuoka, contributing to a dynamic and productive work environment. Their joint efforts emphasize teamwork in the pursuit of innovative solutions.

Conclusion

With a patent that addresses crucial measurement challenges in the industry, Kaoru Miyoshi exemplifies the spirit of innovation at Hitachi, Ltd. His work not only advances technology but also inspires future inventors to explore new possibilities in their respective fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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