Kangpeng Shao

Title: Kangpeng Shao: Innovator in Chip Testing Technology

Introduction

Kangpeng Shao is a notable inventor based in Zhejiang, China. He has made significant contributions to the field of chip testing, particularly through his innovative methods for testing transistors. His work is characterized by a focus on improving efficiency and accuracy in the testing process.

Latest Patents

Kangpeng Shao holds a patent for a "Method for testing a plurality of transistors in a target chip." This invention relates to the chip testing field and provides a method that automatically selects a plurality of pre-defined transistors on the target chip. It adds a connection layer to the key layers of each transistor, allowing the transistor to be tested to connect with and be measured by an outside tester. This approach greatly shortens the design cycle of test chips and reduces the error probability in the design process, thereby improving testing relevancy. He has 1 patent to his name.

Career Highlights

Kangpeng Shao is associated with Semitronix Corporation, where he applies his expertise in chip testing technology. His innovative methods have positioned him as a key figure in the advancement of testing techniques within the semiconductor industry.

Collaborations

Kangpeng has worked alongside talented colleagues such as Yongjun Zheng and Xu Ouyang. Their collaborative efforts contribute to the ongoing development of cutting-edge technologies in the field.

Conclusion

Kangpeng Shao's contributions to chip testing technology exemplify the impact of innovation in the semiconductor industry. His patented methods enhance the efficiency and accuracy of testing processes, marking him as a significant inventor in this domain.